Scholarly Index

W.T. Holman

Vanderbilt University; 2,620 total citations; 120 total publications; best world rank #231

Vanderbilt University

2,620Total citations
120Total publications
28H-index

Published ranking records

FieldWindowWorld rankNational rankImpact score
Radiation Effects in ElectronicsLifetime231US 13196.78
VLSI and Analog Circuit TestingLifetime335US 16296.85
Low-power high-performance VLSI designLifetime595US 27296.06
Advancements in PLL and VCO TechnologiesLifetime714US 19493.41