Scholarly Index

Yanjing Li

Beihang University; 1,918 total citations; 106 total publications; best world rank #323

Beihang University

1,918Total citations
106Total publications
24H-index

Published ranking records

FieldWindowWorld rankNational rankImpact score
Radiation Effects in ElectronicsLifetime359CN 1995.68
VLSI and Analog Circuit TestingLifetime701CN 6094.29
Radiation Effects in Electronics2021-2025323CN 8782.78
VLSI and Analog Circuit Testing2021-2025371CN 10873.29