Scholarly Index
Maksim Jenihhin
Tallinn University of Technology; 838 total citations; 153 total publications; best world rank #74
Tallinn University of Technology
838Total citations
153Total publications
14H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Radiation Effects in Electronics | 2021-2025 | 74 | EE 1 | 93.48 |
| VLSI and Analog Circuit Testing | 2021-2025 | 303 | EE 1 | 76.45 |
| Low-power high-performance VLSI design | 2021-2025 | 880 | EE 2 | 62.35 |