Scholarly Index
Taehwan Yoon
Kwangwoon University; 75 total citations; 7 total publications; best world rank #718
Kwangwoon University
75Total citations
7Total publications
3H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| VLSI and Analog Circuit Testing | 2021-2025 | 718 | KR 32 | 60.61 |