Scholarly Index
Toh‐Ming Lu
Rensselaer Polytechnic Institute; 12,795 total citations; 439 total publications; best world rank #42
Rensselaer Polytechnic Institute
12,795Total citations
439Total publications
57H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Copper Interconnects and Reliability | Lifetime | 42 | US 24 | 99.14 |
| Semiconductor materials and devices | Lifetime | 429 | US 200 | 99.10 |
| Optical Coatings and Gratings | Lifetime | 103 | US 34 | 98.77 |
| Metal and Thin Film Mechanics | Lifetime | 689 | US 192 | 98.37 |
| Surface and Thin Film Phenomena | Lifetime | 271 | US 120 | 98.06 |
| Electron and X-Ray Spectroscopy Techniques | Lifetime | 791 | US 292 | 96.85 |
| Theoretical and Computational Physics | Lifetime | 634 | US 237 | 97.06 |
| nanoparticles nucleation surface interactions | Lifetime | 493 | US 208 | 96.87 |
| Nanofabrication and Lithography Techniques | Lifetime | 571 | US 182 | 94.45 |
| Surface Roughness and Optical Measurements | Lifetime | 635 | US 148 | 93.59 |