Scholarly Index
W. E. Hoke
RTX (United States); 2,929 total citations; 154 total publications; best world rank #762
RTX (United States)
2,929Total citations
154Total publications
30H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| GaN-based semiconductor devices and materials | Lifetime | 992 | US 277 | 96.37 |
| Advanced Semiconductor Detectors and Materials | Lifetime | 762 | US 304 | 95.07 |