Scholarly Index
J. M. Slaughter
IBM (United States); 5,394 total citations; 121 total publications; best world rank #542
IBM (United States)
5,394Total citations
121Total publications
32H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Magnetic properties of thin films | Lifetime | 931 | US 277 | 96.93 |
| Surface Roughness and Optical Measurements | Lifetime | 542 | US 125 | 94.18 |
| Ferroelectric and Negative Capacitance Devices | Lifetime | 664 | US 177 | 94.47 |