Scholarly Index
Heiji Watanabe
The University of Osaka; 5,994 total citations; 605 total publications; best world rank #362
The University of Osaka
5,994Total citations
605Total publications
36H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Copper Interconnects and Reliability | Lifetime | 364 | JP 32 | 96.49 |
| Integrated Circuits and Semiconductor Failure Analysis | Lifetime | 777 | JP 42 | 96.76 |
| Silicon Carbide Semiconductor Technologies | Lifetime | 584 | JP 37 | 97.32 |
| Ferroelectric and Negative Capacitance Devices | Lifetime | 576 | JP 23 | 95.04 |
| Semiconductor materials and devices | 2021-2025 | 744 | JP 31 | 92.48 |
| Silicon Carbide Semiconductor Technologies | 2021-2025 | 789 | JP 26 | 88.37 |
| Copper Interconnects and Reliability | 2021-2025 | 362 | JP 14 | 67.65 |