Scholarly Index

Heiji Watanabe

The University of Osaka; 5,994 total citations; 605 total publications; best world rank #362

The University of Osaka

5,994Total citations
605Total publications
36H-index

Published ranking records

FieldWindowWorld rankNational rankImpact score
Copper Interconnects and ReliabilityLifetime364JP 3296.49
Integrated Circuits and Semiconductor Failure AnalysisLifetime777JP 4296.76
Silicon Carbide Semiconductor TechnologiesLifetime584JP 3797.32
Ferroelectric and Negative Capacitance DevicesLifetime576JP 2395.04
Semiconductor materials and devices2021-2025744JP 3192.48
Silicon Carbide Semiconductor Technologies2021-2025789JP 2688.37
Copper Interconnects and Reliability2021-2025362JP 1467.65