Scholarly Index

Sybille Hellebrand

Paderborn University; 2,087 total citations; 140 total publications; best world rank #263

Paderborn University

2,087Total citations

140Total publications

21H-index

Published ranking records

Field	Window	World rank	National rank	Impact score
VLSI and Analog Circuit Testing	Lifetime	263	DE 15	97.43
Integrated Circuits and Semiconductor Failure Analysis	Lifetime	882	DE 72	96.52
Radiation Effects in Electronics	Lifetime	577	DE 35	94.17
Low-power high-performance VLSI design	Lifetime	994	DE 26	93.83
VLSI and FPGA Design Techniques	Lifetime	851	DE 47	89.75
Engineering and Test Systems	Lifetime	469	DE 19	75.60
VLSI and Analog Circuit Testing	2021-2025	712	DE 42	60.75