Scholarly Index
Jung-Hun Park
Seoul National University; 22 total citations; 4 total publications; best world rank #565
Seoul National University
22Total citations
4Total publications
3H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| VLSI and Analog Circuit Testing | 2021-2025 | 565 | KR 21 | 65.00 |