Scholarly Index
Jongho Park
Yonsei University; 33 total citations; 9 total publications; best world rank #857
Yonsei University
33Total citations
9Total publications
3H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| VLSI and Analog Circuit Testing | 2021-2025 | 857 | KR 40 | 55.99 |