Scholarly Index
C.H. Stapper
IBM (United States); 3,288 total citations; 61 total publications; best world rank #165
IBM (United States)
3,288Total citations
61Total publications
28H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Industrial Vision Systems and Defect Detection | Lifetime | 165 | US 36 | 97.63 |
| VLSI and Analog Circuit Testing | Lifetime | 173 | US 96 | 98.24 |
| Integrated Circuits and Semiconductor Failure Analysis | Lifetime | 498 | US 205 | 97.61 |
| Advancements in Photolithography Techniques | Lifetime | 698 | US 277 | 93.65 |
| Radiation Effects in Electronics | Lifetime | 912 | US 389 | 91.88 |