Scholarly Index
Kenneth M. Butler
University of York; 2,280 total citations; 70 total publications; best world rank #92
University of York
2,280Total citations
70Total publications
22H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| VLSI and Analog Circuit Testing | Lifetime | 294 | GB 7 | 97.16 |
| Integrated Circuits and Semiconductor Failure Analysis | Lifetime | 947 | GB 48 | 96.37 |
| Engineering and Test Systems | Lifetime | 92 | GB 4 | 93.12 |