Scholarly Index
Charles E. Stroud
Auburn University; 2,694 total citations; 135 total publications; best world rank #55
Auburn University
2,694Total citations
135Total publications
29H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| VLSI and Analog Circuit Testing | Lifetime | 127 | US 73 | 98.58 |
| Integrated Circuits and Semiconductor Failure Analysis | Lifetime | 384 | US 160 | 97.97 |
| Radiation Effects in Electronics | Lifetime | 150 | US 90 | 97.56 |
| Physical Unclonable Functions (PUFs) and Hardware Security | Lifetime | 107 | US 55 | 96.04 |
| Engineering and Test Systems | Lifetime | 55 | US 27 | 95.23 |