Scholarly Index

Eby G. Friedman

University of Rochester; 15,591 total citations; 500 total publications; best world rank #24

University of Rochester

15,591Total citations

500Total publications

56H-index

Published ranking records

Field	Window	World rank	National rank	Impact score
Electromagnetic Compatibility and Noise Suppression	Lifetime	24	US 9	99.64
Low-power high-performance VLSI design	Lifetime	26	US 20	99.72
3D IC and TSV technologies	Lifetime	32	US 14	99.39
Electrostatic Discharge in Electronics	Lifetime	30	US 14	99.14
Advancements in Semiconductor Devices and Circuit Design	Lifetime	139	US 69	99.16
Analog and Mixed-Signal Circuit Design	Lifetime	65	US 29	99.07
VLSI and FPGA Design Techniques	Lifetime	29	US 21	99.39
Semiconductor materials and devices	Lifetime	566	US 254	98.92
VLSI and Analog Circuit Testing	Lifetime	76	US 52	99.04
Advanced Memory and Neural Computing	Lifetime	290	US 77	98.36
Advancements in PLL and VCO Technologies	Lifetime	152	US 58	98.09
Embedded Systems Design Techniques	Lifetime	379	US 190	97.57
Interconnection Networks and Systems	Lifetime	481	US 264	97.07
Ferroelectric and Negative Capacitance Devices	Lifetime	441	US 120	95.90
CCD and CMOS Imaging Sensors	Lifetime	893	US 260	92.79
Electronic Packaging and Soldering Technologies	Lifetime	915	US 195	93.60
Quantum-Dot Cellular Automata	Lifetime	846	US 206	78.46
Quantum and electron transport phenomena	2021-2025	588	US 178	89.50
Physics of Superconductivity and Magnetism	2021-2025	756	US 173	88.32
Low-power high-performance VLSI design	2021-2025	265	US 24	83.46
Electromagnetic Compatibility and Noise Suppression	2021-2025	449	US 91	80.34
3D IC and TSV technologies	2021-2025	897	US 147	70.44
VLSI and Analog Circuit Testing	2021-2025	970	US 199	52.55
VLSI and FPGA Design Techniques	2021-2025	732	US 148	40.46