Scholarly Index

Peter W. van Rijn

Global Embedded Technologies (United States); 692 total citations; 52 total publications; best world rank #363

Global Embedded Technologies (United States)

692Total citations
52Total publications
15H-index

Published ranking records

FieldWindowWorld rankNational rankImpact score
Psychometric Methodologies and TestingLifetime514US 31082.48
Advanced Statistical Modeling TechniquesLifetime363US 21175.90
Psychometric Methodologies and Testing2021-2025366US 16036.62
Student Assessment and Feedback2021-2025740US 10234.07