Scholarly Index
K. Kinoshita
Tohoku University; 1,777 total citations; 95 total publications; best world rank #338
Tohoku University
1,777Total citations
95Total publications
22H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| VLSI and Analog Circuit Testing | Lifetime | 353 | JP 7 | 96.79 |
| Radiation Effects in Electronics | Lifetime | 928 | JP 32 | 91.80 |
| Engineering and Test Systems | Lifetime | 338 | JP 8 | 80.63 |