Scholarly Index
C. Cabral
IBM (United States); 6,073 total citations; 183 total publications; best world rank #153
IBM (United States)
6,073Total citations
183Total publications
40H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Copper Interconnects and Reliability | Lifetime | 153 | US 74 | 98.06 |
| Semiconductor materials and interfaces | Lifetime | 489 | US 201 | 97.95 |