Scholarly Index
J. S. Kauppila
Reliable Software Resources (United States); 1,384 total citations; 78 total publications; best world rank #444
Reliable Software Resources (United States)
1,384Total citations
78Total publications
22H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Radiation Effects in Electronics | Lifetime | 444 | US 217 | 95.14 |
| VLSI and Analog Circuit Testing | Lifetime | 696 | US 298 | 94.31 |
| Radiation Effects in Electronics | 2021-2025 | 798 | US 148 | 68.85 |