Scholarly Index
Wilfried Vandervorst
IMEC; 13,258 total citations; 1,111 total publications; best world rank #66
IMEC
13,258Total citations
1,111Total publications
53H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Integrated Circuits and Semiconductor Failure Analysis | Lifetime | 66 | BE 3 | 99.34 |
| Semiconductor materials and devices | Lifetime | 334 | BE 11 | 99.24 |
| Ion-surface interactions and analysis | Lifetime | 155 | BE 3 | 98.84 |
| Silicon and Solar Cell Technologies | Lifetime | 275 | BE 7 | 98.20 |
| Electron and X-Ray Spectroscopy Techniques | Lifetime | 439 | BE 6 | 97.84 |
| Advanced Materials Characterization Techniques | Lifetime | 176 | BE 4 | 97.69 |
| Force Microscopy Techniques and Applications | Lifetime | 434 | BE 4 | 97.94 |
| Advancements in Semiconductor Devices and Circuit Design | Lifetime | 613 | BE 33 | 97.80 |
| Semiconductor materials and interfaces | Lifetime | 661 | BE 16 | 97.51 |
| Ferroelectric and Negative Capacitance Devices | Lifetime | 620 | BE 24 | 94.72 |
| Ion-surface interactions and analysis | 2021-2025 | 835 | BE 8 | 69.31 |
| Advanced Materials Characterization Techniques | 2021-2025 | 785 | BE 6 | 56.30 |