Scholarly Index
N. Seifert
Intel (United States); 3,247 total citations; 68 total publications; best world rank #172
Intel (United States)
3,247Total citations
68Total publications
25H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Radiation Effects in Electronics | Lifetime | 172 | US 102 | 97.32 |
| VLSI and Analog Circuit Testing | Lifetime | 258 | US 134 | 97.47 |