Scholarly Index
Bart Vermeulen
NXP (Netherlands); 1,235 total citations; 59 total publications; best world rank #421
NXP (Netherlands)
1,235Total citations
59Total publications
20H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| VLSI and Analog Circuit Testing | Lifetime | 421 | NL 7 | 96.31 |
| Radiation Effects in Electronics | Lifetime | 711 | NL 12 | 93.24 |