Scholarly Index
Chao Peng
China Electronic Product Reliability and Environmental Test Institute; 1,176 total citations; 114 total publications; best world rank #72
China Electronic Product Reliability and Environmental Test Institute
1,176Total citations
114Total publications
17H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Radiation Effects in Electronics | Lifetime | 848 | CN 60 | 92.27 |
| Semiconductor materials and devices | 2021-2025 | 201 | CN 61 | 96.57 |
| Radiation Effects in Electronics | 2021-2025 | 72 | CN 21 | 93.71 |
| Integrated Circuits and Semiconductor Failure Analysis | 2021-2025 | 187 | CN 40 | 91.84 |
| Silicon Carbide Semiconductor Technologies | 2021-2025 | 299 | CN 121 | 94.46 |
| GaN-based semiconductor devices and materials | 2021-2025 | 920 | CN 428 | 85.80 |
| Spacecraft Dynamics and Control | 2021-2025 | 343 | CN 143 | 75.80 |
| Electrostatic Discharge in Electronics | 2021-2025 | 595 | CN 264 | 67.29 |
| Space Satellite Systems and Control | 2021-2025 | 910 | CN 437 | 66.69 |