Scholarly Index
C.F. Hawkins
Tulane University; 3,402 total citations; 109 total publications; best world rank #140
Tulane University
3,402Total citations
109Total publications
33H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Integrated Circuits and Semiconductor Failure Analysis | Lifetime | 248 | US 113 | 98.42 |
| VLSI and Analog Circuit Testing | Lifetime | 140 | US 80 | 98.50 |
| Electrostatic Discharge in Electronics | Lifetime | 680 | US 201 | 92.72 |