Scholarly Index
B. Kruseman
NXP (Netherlands); 802 total citations; 41 total publications; best world rank #527
NXP (Netherlands)
802Total citations
41Total publications
17H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| VLSI and Analog Circuit Testing | Lifetime | 527 | NL 9 | 95.45 |