Scholarly Index
Janusz Rajski
Siemens (United States); 6,401 total citations; 245 total publications; best world rank #9
Siemens (United States)
6,401Total citations
245Total publications
42H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Integrated Circuits and Semiconductor Failure Analysis | Lifetime | 120 | US 59 | 99.02 |
| VLSI and Analog Circuit Testing | Lifetime | 44 | US 30 | 99.41 |
| Engineering and Test Systems | Lifetime | 9 | US 8 | 99.10 |
| Advancements in Photolithography Techniques | Lifetime | 88 | US 46 | 98.14 |
| VLSI and FPGA Design Techniques | Lifetime | 115 | US 73 | 98.14 |
| Low-power high-performance VLSI design | Lifetime | 281 | US 157 | 97.89 |
| Radiation Effects in Electronics | Lifetime | 244 | US 136 | 96.69 |
| Physical Unclonable Functions (PUFs) and Hardware Security | Lifetime | 90 | US 46 | 96.68 |
| VLSI and Analog Circuit Testing | 2021-2025 | 39 | US 13 | 94.51 |
| Integrated Circuits and Semiconductor Failure Analysis | 2021-2025 | 153 | US 51 | 92.88 |
| Engineering and Test Systems | 2021-2025 | 15 | US 3 | 74.01 |
| VLSI and FPGA Design Techniques | 2021-2025 | 813 | US 158 | 36.10 |