Scholarly Index
Chris A. Mack
Alcon (United States); 3,928 total citations; 311 total publications; best world rank #20
Alcon (United States)
3,928Total citations
311Total publications
27H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Advancements in Photolithography Techniques | Lifetime | 102 | US 51 | 98.03 |
| Industrial Vision Systems and Defect Detection | Lifetime | 211 | US 47 | 97.24 |
| Surface Roughness and Optical Measurements | Lifetime | 190 | US 42 | 96.99 |
| Integrated Circuits and Semiconductor Failure Analysis | Lifetime | 634 | US 255 | 97.19 |
| Advanced Measurement and Metrology Techniques | Lifetime | 535 | US 92 | 95.48 |
| Nanofabrication and Lithography Techniques | Lifetime | 436 | US 141 | 95.41 |
| 3D IC and TSV technologies | Lifetime | 574 | US 146 | 95.30 |
| Advanced optical system design | Lifetime | 271 | US 73 | 94.65 |
| Image Processing Techniques and Applications | Lifetime | 599 | US 133 | 95.27 |
| Space Technology and Applications | Lifetime | 20 | US 10 | 87.24 |
| Academic Writing and Publishing | Lifetime | 176 | US 61 | 77.59 |
| Advancements in Photolithography Techniques | 2021-2025 | 118 | US 20 | 89.66 |
| Integrated Circuits and Semiconductor Failure Analysis | 2021-2025 | 545 | US 156 | 83.93 |
| Electron and X-Ray Spectroscopy Techniques | 2021-2025 | 775 | US 223 | 73.61 |
| Surface Roughness and Optical Measurements | 2021-2025 | 847 | US 52 | 56.72 |