Scholarly Index
S. Y. Tong
Tsinghua University; 11,236 total citations; 396 total publications; best world rank #18
Tsinghua University
11,236Total citations
396Total publications
55H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Crystallography and Radiation Phenomena | Lifetime | 18 | CN 2 | 98.82 |
| Electron and X-Ray Spectroscopy Techniques | Lifetime | 99 | CN 5 | 99.21 |
| Surface and Thin Film Phenomena | Lifetime | 158 | CN 7 | 98.68 |
| Semiconductor materials and devices | Lifetime | 954 | CN 80 | 98.44 |
| X-ray Spectroscopy and Fluorescence Analysis | Lifetime | 302 | CN 2 | 97.70 |
| Advanced Electron Microscopy Techniques and Applications | Lifetime | 161 | CN 9 | 97.79 |
| Advanced Chemical Physics Studies | Lifetime | 857 | CN 29 | 98.39 |
| X-ray Diffraction in Crystallography | Lifetime | 414 | CN 13 | 96.36 |
| GaN-based semiconductor devices and materials | Lifetime | 973 | CN 169 | 96.43 |
| Advanced X-ray Imaging Techniques | Lifetime | 861 | CN 58 | 93.87 |
| Chemical and Physical Properties of Materials | Lifetime | 324 | CN 21 | 87.11 |