Scholarly Index
B. L. Bhuva
Vanderbilt University; 7,992 total citations; 356 total publications; best world rank #32
Vanderbilt University
7,992Total citations
356Total publications
47H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Radiation Effects in Electronics | Lifetime | 32 | US 25 | 98.99 |
| Integrated Circuits and Semiconductor Failure Analysis | Lifetime | 142 | US 69 | 98.94 |
| VLSI and Analog Circuit Testing | Lifetime | 58 | US 37 | 99.25 |
| Semiconductor materials and devices | Lifetime | 777 | US 331 | 98.64 |
| Low-power high-performance VLSI design | Lifetime | 215 | US 123 | 98.35 |
| Electrostatic Discharge in Electronics | Lifetime | 442 | US 136 | 94.65 |
| Physical Unclonable Functions (PUFs) and Hardware Security | Lifetime | 930 | US 325 | 81.07 |
| Radiation Effects in Electronics | 2021-2025 | 49 | US 9 | 94.70 |
| VLSI and Analog Circuit Testing | 2021-2025 | 72 | US 23 | 91.26 |
| Integrated Circuits and Semiconductor Failure Analysis | 2021-2025 | 428 | US 121 | 86.39 |
| Low-power high-performance VLSI design | 2021-2025 | 526 | US 53 | 72.99 |