Scholarly Index
E. Cartier
IBM (United States); 12,074 total citations; 253 total publications; best world rank #47
IBM (United States)
12,074Total citations
253Total publications
54H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Integrated Circuits and Semiconductor Failure Analysis | Lifetime | 47 | US 25 | 99.44 |
| Advancements in Semiconductor Devices and Circuit Design | Lifetime | 73 | US 44 | 99.48 |
| Semiconductor materials and devices | Lifetime | 181 | US 96 | 99.49 |
| Ferroelectric and Negative Capacitance Devices | Lifetime | 143 | US 39 | 98.15 |
| Electron and X-Ray Spectroscopy Techniques | Lifetime | 437 | US 172 | 97.85 |
| Electronic and Structural Properties of Oxides | Lifetime | 665 | US 197 | 97.58 |
| Advancements in Photolithography Techniques | Lifetime | 807 | US 319 | 93.17 |