| Electron and X-Ray Spectroscopy Techniques | Lifetime | 11 | US 5 | 99.77 |
| Advanced Electron Microscopy Techniques and Applications | Lifetime | 13 | US 7 | 99.58 |
| Semiconductor materials and devices | Lifetime | 97 | US 56 | 99.65 |
| Advanced Materials Characterization Techniques | Lifetime | 16 | US 8 | 99.46 |
| Welding Techniques and Residual Stresses | Lifetime | 29 | US 4 | 99.52 |
| Fatigue and fracture mechanics | Lifetime | 32 | US 12 | 99.65 |
| Advanced Semiconductor Detectors and Materials | Lifetime | 33 | US 17 | 99.29 |
| Non-Destructive Testing Techniques | Lifetime | 45 | US 17 | 99.31 |
| GaN-based semiconductor devices and materials | Lifetime | 68 | US 33 | 99.48 |
| Semiconductor materials and interfaces | Lifetime | 90 | US 44 | 99.29 |
| Ga2O3 and related materials | Lifetime | 62 | US 24 | 99.26 |
| Integrated Circuits and Semiconductor Failure Analysis | Lifetime | 100 | US 49 | 99.14 |
| ZnO doping and properties | Lifetime | 173 | US 32 | 99.34 |
| Magnetic properties of thin films | Lifetime | 144 | US 44 | 99.12 |
| Metal and Thin Film Mechanics | Lifetime | 395 | US 119 | 98.92 |
| Semiconductor Quantum Structures and Devices | Lifetime | 385 | US 150 | 98.86 |
| Electronic and Structural Properties of Oxides | Lifetime | 322 | US 109 | 98.64 |
| Ion-surface interactions and analysis | Lifetime | 369 | US 149 | 97.97 |
| High Temperature Alloys and Creep | Lifetime | 171 | US 50 | 98.17 |
| Surface and Thin Film Phenomena | Lifetime | 264 | US 117 | 98.09 |
| Chalcogenide Semiconductor Thin Films | Lifetime | 672 | US 137 | 97.92 |
| nanoparticles nucleation surface interactions | Lifetime | 326 | US 141 | 97.64 |
| Nanowire Synthesis and Applications | Lifetime | 466 | US 148 | 97.54 |
| Magnetic Properties and Applications | Lifetime | 589 | US 142 | 97.45 |
| Material Properties and Failure Mechanisms | Lifetime | 253 | US 76 | 96.37 |
| Silicon Carbide Semiconductor Technologies | Lifetime | 705 | US 176 | 96.89 |
| Force Microscopy Techniques and Applications | Lifetime | 955 | US 368 | 96.36 |
| Advanced X-ray Imaging Techniques | Lifetime | 525 | US 181 | 95.72 |
| Nuclear materials and radiation effects | Lifetime | 584 | US 136 | 95.11 |
| Microstructure and mechanical properties | Lifetime | 933 | US 255 | 96.41 |
| Crystallography and Radiation Phenomena | Lifetime | 377 | US 104 | 93.21 |
| Fire effects on concrete materials | Lifetime | 356 | US 38 | 94.90 |
| Advanced Welding Techniques Analysis | Lifetime | 775 | US 90 | 94.56 |
| High-Velocity Impact and Material Behavior | Lifetime | 922 | US 290 | 94.25 |
| Advancements in Photolithography Techniques | Lifetime | 772 | US 307 | 93.31 |
| Copper Interconnects and Reliability | Lifetime | 982 | US 333 | 93.18 |
| Engineering Structural Analysis Methods | Lifetime | 473 | US 101 | 89.98 |
| Photocathodes and Microchannel Plates | Lifetime | 807 | US 328 | 87.02 |
| Surface Treatment and Residual Stress | Lifetime | 671 | US 72 | 84.79 |
| Semiconductor Quantum Structures and Devices | 2021-2025 | 473 | US 60 | 87.46 |
| Advanced Semiconductor Detectors and Materials | 2021-2025 | 335 | US 69 | 81.40 |