Scholarly Index

L. C. Feldman

Rutgers, The State University of New Jersey; 21,795 total citations; 548 total publications; best world rank #84

Rutgers, The State University of New Jersey

21,795Total citations

548Total publications

75H-index

Published ranking records

Field	Window	World rank	National rank	Impact score
Semiconductor materials and devices	Lifetime	116	US 67	99.60
Ion-surface interactions and analysis	Lifetime	84	US 49	99.19
Semiconductor materials and interfaces	Lifetime	118	US 55	99.16
Copper Interconnects and Reliability	Lifetime	98	US 51	98.48
Silicon Carbide Semiconductor Technologies	Lifetime	174	US 62	98.99
Silicon and Solar Cell Technologies	Lifetime	189	US 74	98.57
Electron and X-Ray Spectroscopy Techniques	Lifetime	288	US 121	98.45
Integrated Circuits and Semiconductor Failure Analysis	Lifetime	342	US 142	98.14
Surface and Thin Film Phenomena	Lifetime	243	US 111	98.20
Silicon Nanostructures and Photoluminescence	Lifetime	352	US 118	97.51
Transition Metal Oxide Nanomaterials	Lifetime	562	US 72	96.69
Thin-Film Transistor Technologies	Lifetime	839	US 195	96.67
Advanced Materials Characterization Techniques	Lifetime	415	US 144	95.96
Crystallography and Radiation Phenomena	Lifetime	358	US 98	93.44
Hannah Arendt's Political Philosophy	Lifetime	482	US 194	57.30
Political Theology and Sovereignty	Lifetime	558	US 166	56.73