Scholarly Index
Nilanjan Mukherjee
Siemens (United States); 3,299 total citations; 169 total publications; best world rank #119
Siemens (United States)
3,299Total citations
169Total publications
26H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Integrated Circuits and Semiconductor Failure Analysis | Lifetime | 626 | US 252 | 97.21 |
| VLSI and Analog Circuit Testing | Lifetime | 223 | US 118 | 97.77 |
| Radiation Effects in Electronics | Lifetime | 780 | US 341 | 92.78 |
| Engineering and Test Systems | Lifetime | 119 | US 47 | 91.35 |
| VLSI and Analog Circuit Testing | 2021-2025 | 223 | US 59 | 80.90 |
| VLSI and FPGA Design Techniques | 2021-2025 | 996 | US 187 | 25.05 |