Scholarly Index

Nilanjan Mukherjee

Siemens (United States); 3,299 total citations; 169 total publications; best world rank #119

Siemens (United States)

3,299Total citations
169Total publications
26H-index

Published ranking records

FieldWindowWorld rankNational rankImpact score
Integrated Circuits and Semiconductor Failure AnalysisLifetime626US 25297.21
VLSI and Analog Circuit TestingLifetime223US 11897.77
Radiation Effects in ElectronicsLifetime780US 34192.78
Engineering and Test SystemsLifetime119US 4791.35
VLSI and Analog Circuit Testing2021-2025223US 5980.90
VLSI and FPGA Design Techniques2021-2025996US 18725.05