Scholarly Index
G. A. Baraff
Nokia (United States); 8,300 total citations; 135 total publications; best world rank #192
Nokia (United States)
8,300Total citations
135Total publications
42H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Semiconductor materials and interfaces | Lifetime | 506 | US 206 | 97.90 |
| Surface and Thin Film Phenomena | Lifetime | 262 | US 116 | 98.09 |
| Electron and X-Ray Spectroscopy Techniques | Lifetime | 611 | US 231 | 97.30 |
| Semiconductor Quantum Structures and Devices | Lifetime | 937 | US 336 | 97.69 |
| Quantum and electron transport phenomena | Lifetime | 940 | US 335 | 97.16 |
| Copper Interconnects and Reliability | Lifetime | 874 | US 294 | 93.73 |
| Chemical and Physical Properties of Materials | Lifetime | 192 | US 75 | 90.94 |
| Advanced Physical and Chemical Molecular Interactions | Lifetime | 502 | US 227 | 89.39 |