Scholarly Index
F. M. d’Heurle
IBM (United States); 9,450 total citations; 226 total publications; best world rank #29
IBM (United States)
9,450Total citations
226Total publications
53H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Copper Interconnects and Reliability | Lifetime | 29 | US 18 | 99.27 |
| Semiconductor materials and interfaces | Lifetime | 85 | US 42 | 99.32 |
| Intermetallics and Advanced Alloy Properties | Lifetime | 64 | US 25 | 99.28 |
| Silicon and Solar Cell Technologies | Lifetime | 84 | US 31 | 99.10 |
| Electronic Packaging and Soldering Technologies | Lifetime | 82 | US 22 | 98.78 |
| Semiconductor materials and devices | Lifetime | 526 | US 237 | 98.98 |
| Silicon Nanostructures and Photoluminescence | Lifetime | 276 | US 97 | 97.87 |
| Surface and Thin Film Phenomena | Lifetime | 269 | US 119 | 98.07 |
| Advanced Materials Characterization Techniques | Lifetime | 938 | US 321 | 92.35 |
| Metallurgical and Alloy Processes | Lifetime | 526 | US 104 | 92.27 |