Scholarly Index
S. Yoshida
The University of Tokyo; 5,814 total citations; 151 total publications; best world rank #391
The University of Tokyo
5,814Total citations
151Total publications
38H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| GaN-based semiconductor devices and materials | Lifetime | 391 | JP 56 | 98.15 |
| Silicon Carbide Semiconductor Technologies | Lifetime | 449 | JP 28 | 97.76 |
| Copper Interconnects and Reliability | Lifetime | 529 | JP 50 | 95.42 |
| Ga2O3 and related materials | Lifetime | 760 | JP 86 | 95.81 |