Scholarly Index

E.J. McCluskey

Stanford University; 12,102 total citations; 302 total publications; best world rank #7

Stanford University

12,102Total citations

302Total publications

54H-index

Published ranking records

Field	Window	World rank	National rank	Impact score
Integrated Circuits and Semiconductor Failure Analysis	Lifetime	33	US 20	99.51
Radiation Effects in Electronics	Lifetime	13	US 11	99.26
VLSI and Analog Circuit Testing	Lifetime	15	US 13	99.73
Engineering and Test Systems	Lifetime	7	US 6	99.32
Physical Unclonable Functions (PUFs) and Hardware Security	Lifetime	31	US 17	98.48
Embedded Systems Design Techniques	Lifetime	157	US 85	98.84
Low-power high-performance VLSI design	Lifetime	194	US 111	98.47
Distributed systems and fault tolerance	Lifetime	322	US 196	97.74
VLSI and FPGA Design Techniques	Lifetime	189	US 110	97.07
Formal Methods in Verification	Lifetime	502	US 196	95.54
Software Testing and Debugging Techniques	Lifetime	471	US 188	95.81
Experimental Learning in Engineering	Lifetime	806	US 413	91.25
Electrostatic Discharge in Electronics	Lifetime	922	US 260	90.85