Scholarly Index
Yijun Shi
China Electronic Product Reliability and Environmental Test Institute; 574 total citations; 107 total publications; best world rank #198
China Electronic Product Reliability and Environmental Test Institute
574Total citations
107Total publications
14H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Semiconductor materials and devices | 2021-2025 | 772 | CN 231 | 92.32 |
| GaN-based semiconductor devices and materials | 2021-2025 | 366 | CN 194 | 92.85 |
| Electrostatic Discharge in Electronics | 2021-2025 | 198 | CN 94 | 84.17 |
| Silicon Carbide Semiconductor Technologies | 2021-2025 | 958 | CN 370 | 86.51 |