Scholarly Index

Balaji Narasimham

Broadcom (United States); 2,433 total citations; 88 total publications; best world rank #220

Broadcom (United States)

2,433Total citations
88Total publications
27H-index

Published ranking records

FieldWindowWorld rankNational rankImpact score
Radiation Effects in ElectronicsLifetime220US 12496.90
Integrated Circuits and Semiconductor Failure AnalysisLifetime977US 36096.30
VLSI and Analog Circuit TestingLifetime422US 20196.29
Radiation Effects in Electronics2021-2025227US 3986.51
VLSI and Analog Circuit Testing2021-2025304US 7176.44