Scholarly Index

Sokrates T. Pantelides

Vanderbilt University; 44,058 total citations; 899 total publications; best world rank #10

Vanderbilt University

44,058Total citations

899Total publications

104H-index

Published ranking records

Field	Window	World rank	National rank	Impact score
Semiconductor materials and devices	Lifetime	17	US 13	99.91
Semiconductor materials and interfaces	Lifetime	10	US 4	99.88
Silicon and Solar Cell Technologies	Lifetime	11	US 3	99.76
Thin-Film Transistor Technologies	Lifetime	44	US 15	99.61
Silicon Nanostructures and Photoluminescence	Lifetime	61	US 23	99.25
Surface and Thin Film Phenomena	Lifetime	69	US 36	99.25
Advancements in Semiconductor Devices and Circuit Design	Lifetime	151	US 75	99.12
Electronic and Structural Properties of Oxides	Lifetime	155	US 64	99.19
Graphene research and applications	Lifetime	328	US 86	99.22
2D Materials and Applications	Lifetime	202	US 51	98.99
Ion-surface interactions and analysis	Lifetime	250	US 103	98.38
Semiconductor Quantum Structures and Devices	Lifetime	380	US 146	98.87
Silicon Carbide Semiconductor Technologies	Lifetime	269	US 81	98.51
Molecular Junctions and Nanostructures	Lifetime	523	US 203	98.46
Integrated Circuits and Semiconductor Failure Analysis	Lifetime	597	US 240	97.30
GaN-based semiconductor devices and materials	Lifetime	675	US 206	97.29
Radiation Effects in Electronics	Lifetime	273	US 145	96.42
Ga2O3 and related materials	Lifetime	561	US 120	96.65
Electron and X-Ray Spectroscopy Techniques	Lifetime	988	US 358	96.32
Nanowire Synthesis and Applications	Lifetime	884	US 242	95.89
Advanced Electron Microscopy Techniques and Applications	Lifetime	963	US 343	92.11
Chemical and Physical Properties of Materials	Lifetime	329	US 120	87.03
Semiconductor materials and devices	2021-2025	274	US 38	95.89
Electronic and Structural Properties of Oxides	2021-2025	527	US 96	90.56
Radiation Effects in Electronics	2021-2025	812	US 151	68.61
Surface and Thin Film Phenomena	2021-2025	637	US 98	46.64