Scholarly Index

José‐Luis Olvera‐Cervantes

National Institute of Astrophysics, Optics and Electronics; 923 total citations; 102 total publications; best world rank #220

National Institute of Astrophysics, Optics and Electronics

923Total citations
102Total publications
16H-index

Published ranking records

FieldWindowWorld rankNational rankImpact score
Microwave and Dielectric Measurement TechniquesLifetime570MX 490.69
Microwave and Dielectric Measurement Techniques2021-2025220MX 179.58