Scholarly Index
M. Copel
IBM Research - Thomas J. Watson Research Center; 11,601 total citations; 198 total publications; best world rank #144
IBM Research - Thomas J. Watson Research Center
11,601Total citations
198Total publications
55H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Semiconductor materials and devices | Lifetime | 178 | US 94 | 99.49 |
| Integrated Circuits and Semiconductor Failure Analysis | Lifetime | 144 | US 71 | 98.93 |
| Semiconductor materials and interfaces | Lifetime | 241 | US 108 | 98.65 |
| Ion-surface interactions and analysis | Lifetime | 331 | US 135 | 98.08 |
| Electronic and Structural Properties of Oxides | Lifetime | 381 | US 125 | 98.42 |
| Electron and X-Ray Spectroscopy Techniques | Lifetime | 590 | US 227 | 97.37 |
| Surface and Thin Film Phenomena | Lifetime | 833 | US 289 | 95.50 |