Scholarly Index
Michael L. Alles
Vanderbilt University; 5,107 total citations; 235 total publications; best world rank #95
Vanderbilt University
5,107Total citations
235Total publications
38H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Radiation Effects in Electronics | Lifetime | 95 | US 64 | 98.17 |
| Integrated Circuits and Semiconductor Failure Analysis | Lifetime | 468 | US 196 | 97.71 |
| Advancements in Semiconductor Devices and Circuit Design | Lifetime | 643 | US 237 | 97.74 |
| VLSI and Analog Circuit Testing | Lifetime | 887 | US 359 | 93.14 |
| Radiation Effects in Electronics | 2021-2025 | 98 | US 14 | 92.39 |