Scholarly Index

Rouwaida Kanj

American University of Beirut; 1,636 total citations; 117 total publications; best world rank #760

American University of Beirut

1,636Total citations
117Total publications
18H-index

Published ranking records

FieldWindowWorld rankNational rankImpact score
Low-power high-performance VLSI designLifetime760LB 295.09
VLSI and Analog Circuit TestingLifetime819LB 193.56
VLSI and FPGA Design TechniquesLifetime904LB 189.24