Scholarly Index
J. Savir
New Jersey Institute of Technology; 2,139 total citations; 99 total publications; best world rank #34
New Jersey Institute of Technology
2,139Total citations
99Total publications
23H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| VLSI and Analog Circuit Testing | Lifetime | 222 | US 117 | 97.80 |
| Engineering and Test Systems | Lifetime | 34 | US 18 | 96.62 |
| Integrated Circuits and Semiconductor Failure Analysis | Lifetime | 730 | US 285 | 96.91 |
| Physical Unclonable Functions (PUFs) and Hardware Security | Lifetime | 351 | US 152 | 91.18 |
| VLSI and FPGA Design Techniques | Lifetime | 669 | US 290 | 91.65 |