Scholarly Index
Yi Shen
Tianjin Institute of Metrological Supervision Testing; 956 total citations; 93 total publications; best world rank #32
Tianjin Institute of Metrological Supervision Testing
956Total citations
93Total publications
18H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Analog and Mixed-Signal Circuit Design | Lifetime | 611 | CN 68 | 95.78 |
| CCD and CMOS Imaging Sensors | Lifetime | 719 | CN 80 | 93.77 |
| Analog and Mixed-Signal Circuit Design | 2021-2025 | 32 | CN 14 | 97.49 |
| CCD and CMOS Imaging Sensors | 2021-2025 | 93 | CN 48 | 93.12 |
| Advancements in Semiconductor Devices and Circuit Design | 2021-2025 | 525 | CN 121 | 89.63 |
| Radio Frequency Integrated Circuit Design | 2021-2025 | 814 | CN 333 | 83.72 |
| Low-power high-performance VLSI design | 2021-2025 | 328 | CN 75 | 80.78 |
| Advancements in PLL and VCO Technologies | 2021-2025 | 311 | CN 104 | 76.98 |