Scholarly Index
Jerry R. Burch
Synopsys (United States); 5,350 total citations; 38 total publications; best world rank #494
Synopsys (United States)
5,350Total citations
38Total publications
19H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| VLSI and Analog Circuit Testing | Lifetime | 556 | US 242 | 95.24 |
| Formal Methods in Verification | Lifetime | 494 | US 191 | 95.58 |
| Radiation Effects in Electronics | Lifetime | 573 | US 269 | 94.20 |