Scholarly Index
Ivan Ndip
Fraunhofer Institute for Reliability and Microintegration; 1,489 total citations; 195 total publications; best world rank #496
Fraunhofer Institute for Reliability and Microintegration
1,489Total citations
195Total publications
18H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| 3D IC and TSV technologies | Lifetime | 496 | DE 20 | 95.68 |
| Electromagnetic Compatibility and Noise Suppression | Lifetime | 718 | DE 36 | 95.36 |
| Electronic Packaging and Soldering Technologies | Lifetime | 775 | DE 38 | 94.39 |
| Electromagnetic Compatibility and Noise Suppression | 2021-2025 | 883 | DE 39 | 68.80 |