Scholarly Index
C. Lavoie
IBM Research - Thomas J. Watson Research Center; 6,908 total citations; 264 total publications; best world rank #311
IBM Research - Thomas J. Watson Research Center
6,908Total citations
264Total publications
41H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Semiconductor materials and interfaces | Lifetime | 311 | US 140 | 98.45 |
| Silicon and Solar Cell Technologies | Lifetime | 511 | US 166 | 97.29 |
| Surface and Thin Film Phenomena | Lifetime | 980 | US 341 | 94.83 |
| Copper Interconnects and Reliability | Lifetime | 957 | US 322 | 93.32 |