Scholarly Index
Yoni Xiong
Vanderbilt University; 169 total citations; 38 total publications; best world rank #74
Vanderbilt University
169Total citations
38Total publications
8H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| Radiation Effects in Electronics | 2021-2025 | 75 | US 10 | 93.44 |
| VLSI and Analog Circuit Testing | 2021-2025 | 74 | US 24 | 91.13 |
| Integrated Circuits and Semiconductor Failure Analysis | 2021-2025 | 282 | US 86 | 89.57 |
| Advancements in Semiconductor Devices and Circuit Design | 2021-2025 | 880 | US 94 | 85.14 |